Device (HBM, MM, CDM and Latch Up) Testing Service
In Collaboration & Partnership with Phasix ESD, Innospectra is authorised to market their full suite of ISO accredited testing services which includes HBM, MM, CDM and Latch Up . Phasix ESD is a UKAS Test lab specialising in ESD & Latch Up testing and qualification to the latest standards . Phasix ESD complies with all the necessary MIL-STD, JEDEC, AEC & ESDA Standards. All device testing will be done at Phasix ESD in UK.
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Some of the offered services include :
- ISO17025/UKAS/9001 Human Body Model Testing:
- Thermo Mk2SE, 768 Pin Channel nominal capability
- With special fixturing we can exceed 768 pin channels
- Use of ‘2 pin’ tester approach for devices c4000+ pins
- Latest standard compatibility
- ANSI/ESDA/JEDEC JS-001-2010/11/12/14
- JEDEC EIA/JESD22-A114-F and modified Partition Model
- MIL-STD 883J Method 3015.9
- AEC-Q100-002-REV-E (ICs)
- AEC-Q101-001-REV-A (Discretes)
- ANSI/ESD STM5.1-2007
- ESCC Basic Specification No. 23800
- FOTP-129 (GR 468)
- Optional I-V curve tracing
- Before-and-after DUT stressing with curve comparison, highlighting significant differences
- Thermo Mk2SE, 768 Pin Channel nominal capability
- ISO17025/UKAS/9001 Machine Model Testing:
- Thermo Mk2SE, 768 Pin Channel nominal capability
- With special fixturing we can exceed 768 pin channels
- Use of ‘2 pin’ tester approach for devices c4000+ pins
- Latest standard compatibility
- ANSI/ESDA/JEDEC JS-001-2010/11/12/14
- JEDEC EIA/JESD22-A114-F and modified Partition Model
- JEDEC EIA/JESD22-A114-F and modified Partition Model
- AEC-Q100-002-REV-E (ICs)
- AEC-Q101-001-REV-A (Discretes)
- ANSI/ESD STM5.1-2007
- ESCC Basic Specification No. 23800
- FOTP-129 (GR 468)
- Optional I-V curve tracing
- Before-and-after DUT stressing with curve comparison, highlighting significant differences
- Thermo Mk2SE, 768 Pin Channel nominal capability
- ISO17025/UKAS/9001 Charged Device Model Testing:
- Thermo RCDM3, unlimited pin capability
- Special Fixturing for small devices
- Latest standard compatibility
- ANSI/ESDA/JEDEC JS-002-2014
- JEDEC JESD22-C101F
- AEC-Q100-011 Rev-C1 (ICs)
- AEC-Q101-005-Rev A (Discretes)
- ANSI/ESD STM5.3.1-2009
- ANSI/ESDA/JEDEC JS-002-2014
- Optional I-V curve tracing
- Before-and-after DUT stressing with curve comparison, highlighting significant differences
